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Test Piece

Test Piece

Product description:    

Silicon wafer - test piece    

1. Diameter: 2~12 inches    

2. The test piece is a silicon wafer used for processing technology inspection, area and processing cleanliness inspection. To inspect the status and stability of each equipment and process. This type of film can be used as a companion film, or as a positive film that does not require electrical properties, such as certain MEMS fields or certain materials and physics fields.    

3. The parameters of this kind of film are the same as the main film, and the price is different. Unscrupulous merchants in the market tend to use the second film as the main film. When purchasing, you must choose a regular manufacturer to buy.    





Contact: Mike

Phone: +86-19820819249

Tel: +86-19820819249

Email: nanofab@diaotuotech.com

Add: 1807, Block B, Jingang Center, Jingang Building, Heye Community, Xixiang Street, Bao'an District, Shenzhen