Atomic force microscope 

Type: Dimension Fast Scan

Manufacturer: BRUKER (U.S.A)

Scan fast without loss of resolution, loss of force control, added complexity, or additional operating costs. 

High resolution of a high-performance AFM. 

Non-linear parameters in XYZ direction: <0.5%

Sample size and fixing method: 210mm diameter, vacuum adsorption, ≤15mm thickness

Controller: Nano Scope V

Vibration isolation L Optional shockproof platform or soundproof and shockproof platform, pneumatic