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AFM(Atomic Force Microscope)

  • Dimension Fast Scan
Dimension Fast Scan

Atomic force microscope 

Type: Dimension Fast Scan

Manufacturer: BRUKER (U.S.A)

Scan fast without loss of resolution, loss of force control, added complexity, or additional operating costs. 

High resolution of a high-performance AFM. 

Non-linear parameters in XYZ direction: <0.5%

Sample size and fixing method: 210mm diameter, vacuum adsorption, ≤15mm thickness

Controller: Nano Scope V

Vibration isolation L Optional shockproof platform or soundproof and shockproof platform, pneumatic




Contact: Mike

Phone: +86-19820819249

Tel: +86-19820819249

Email: nanofab@diaotuotech.com

Add: 1807, Block B, Jingang Center, Jingang Building, Heye Community, Xixiang Street, Bao'an District, Shenzhen