Atomic force microscope
Type: Dimension Fast Scan
Manufacturer: BRUKER (U.S.A)
Scan fast without loss of resolution, loss of force control, added complexity, or additional operating costs.
High resolution of a high-performance AFM.
Non-linear parameters in XYZ direction: <0.5%
Sample size and fixing method: 210mm diameter, vacuum adsorption, ≤15mm thickness
Controller: Nano Scope V
Vibration isolation L Optional shockproof platform or soundproof and shockproof platform, pneumatic