SUMMIT 11000B-M PROBE STATION

The Cascade Summit 11000 probe station test system, which is integrated with Keithley 4200 semiconductor characteristic analysis system, can be used    for high-precision position, different processing temperature, laser processing and small  current or voltage detection. This system is mainly for measuring the current-voltage , capacitor-voltage and impedance characteristics of inorganic or organic semiconductor devices, including diode, transistor, and CMOS et al.